| Autor: |
O. Ballan, Jue Arver, Christina Smith, Pierre Maillard, Michael J. Hart, Y. P. Chen |
| Rok vydání: |
2018 |
| Předmět: |
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| Zdroj: |
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018). |
| DOI: |
10.1109/nsrec.2018.8584299 |
| Popis: |
This paper presents a test methodology using Xilinx System Validation Tool (SVT) design suite to characterize the single event response of Xilinx's 16nm Zynq Ultrascale+ MPSoC dual & quad ARM core processors. Accelerated SEU beam test of a XCZU9EG device was performed using the 64MeV Proton source at Crocker Nuclear Laboratory (CNL). Single-event characterization results are presented and categorized in terms of detectability and correctability. SEU test results show that the overall Processor System (PS) FIT FIT is ≤ 1, with all safety mechanisms enabled and no uncorrectable events were observed in the PS RAM. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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