Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon

Autor:	Ping-Yi Hsieh, Artemisia Tsiara, Barry O'Sullivan, Didit Yudistira, Marina Baryshnikova, Guido Groeseneken, Bernardette Kunert, Marianna Pantouvaki, Joris Van Campenhout, Ingrid De Wolf
Rok vydání:	2022
Zdroj:	2022 IEEE International Reliability Physics Symposium (IRPS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1197339e394993111092d780a4b5c464 https://doi.org/10.1109/irps48227.2022.9764597 Zobrazit plný text záznamu