Microcantilever Q control via capacitive coupling

Autor:	J.E. Hoffman, Cun Ye, Jeehoon Kim, Martin Zech, Magdalena Huefner, Martin Ashby Blood-Forsythe, Adam Pivonka
Rok vydání:	2012
Předmět:	Capacitive coupling Materials science Cantilever Physics and Astronomy (miscellaneous) business.industry Orders of magnitude (temperature) Ultra-high vacuum Analytical chemistry Quality (physics) Q factor Optoelectronics Sensitivity (control systems) Thin film business
Zdroj:	Applied Physics Letters. 101:173110
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.4764025
Popis:	We introduce a versatile method to control the quality factor Q of a conducting cantilever in an atomic force microscope (AFM) via capacitive coupling to the local environment. Using this method, Q may be reversibly tuned to within ∼10% of any desired value over several orders of magnitude. A point-mass oscillator model describes the measured effect. Our simple Q control module increases the AFM functionality by allowing greater control of parameters such as scan speed and force gradient sensitivity, which we demonstrate by topographic imaging of a VO2 thin film in high vacuum.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::118aef739e4083b14580641a729bed22 https://doi.org/10.1063/1.4764025 Zobrazit plný text záznamu