| Autor: |
Wei-Chiao Wang, Sung-Mao Wu, Chia-Hung Su, Min-Jun Guo, Bo-You Chen, Min-Shang Lin |
| Rok vydání: |
2019 |
| Předmět: |
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| Zdroj: |
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC). |
| DOI: |
10.23919/emctokyo.2019.8893949 |
| Popis: |
Highly integration and complexity of modern system in package (SiP) lead to critical issues of Power Integrity (PI), Signal Integrity (SI) and Electromagnetic Compatibility (EMC). In this paper, the Simultaneous Switching Noise (SSN) inducing cavity resonance is visualized via near field scan in both frequency. Furthermore, decoupling capacitors suppressing the resonance is also measured by near field scan for comparisons. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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