Effect of thermal annealing on structural and optical properties of In2S3 thin films

Autor:	Sonu Choudhary
Rok vydání:	2015
Předmět:	chemistry.chemical_classification Materials science Sulfide Annealing (metallurgy) business.industry Mineralogy chemistry.chemical_element Amorphous solid Crystallinity chemistry Optoelectronics Thin film business Refractive index Indium Diffractometer
Zdroj:	AIP Conference Proceedings.
ISSN:	0094-243X
DOI:	10.1063/1.4929234
Popis:	There is a highly need of an alternate of toxic materials CdS for solar cell applications and indium sulfide is found the most suitable candidate to replace CdS due to its non-toxic and environmental friendly nature. In this paper, the effect of thermal annealing on the structural and optical properties of indium sulfide (In2S3) thin films is undertaken. The indium sulfide thin films of 121 nm were deposited on glass substrates employing thermal evaporation method. The films were subjected to the X-ray diffractometer and UV-Vis spectrophotometer respectively for structural and optical analysis. The XRD pattern show that the as-deposited thin film was amorphous in nature and crystallinity is found to be varied with annealing temperature. The optical analysis reveals that the optical band gap is varied with annealing. The optical parameters like absorption coefficient, extinction coefficient and refractive index were calculated. The results are in good agreement with available literature.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::115704987eaa058cb7b8e809d5acdc95 https://doi.org/10.1063/1.4929234 Zobrazit plný text záznamu