Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing

Autor:	Rafael N. M. Oliveira, Fabio G. R. G. da Silva, Ricardo Reis, Rafael B. Schvittz, Cristina Meinhardt
Rok vydání:	2022
Zdroj:	2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1124c896ed426ce5accb17a7d86c28b9 https://doi.org/10.1109/sbcci55532.2022.9893240 Zobrazit plný text záznamu