Advanced microscopic techniques used for integrated circuits authenticity analysis

Autor:	Petr Neumann, Vojtěch Křesálek, Milan Navratil
Rok vydání:	2018
Předmět:	History Materials science law Electronic engineering Integrated circuit Computer Science Applications Education law.invention
Zdroj:	Journal of Physics: Conference Series. 1065:102015
ISSN:	1742-6596 1742-6588
DOI:	10.1088/1742-6596/1065/10/102015
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1114dc634e2ba11033c50380215b928d https://doi.org/10.1088/1742-6596/1065/10/102015 Zobrazit plný text záznamu