Synthesis of the hexaferrite semiconductor SrFe12O19 and its application in the photodegradation of Basic Red 46
Autor: | Mohamed Trari, Billal Brahimi, Mounir Mellal, Elhadj Mekatel |
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Rok vydání: | 2021 |
Předmět: |
Materials science
Scanning electron microscope business.industry Radical Analytical chemistry Condensed Matter Physics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Catalysis Semiconductor Yield (chemistry) Irradiation Diffuse reflection Electrical and Electronic Engineering Photodegradation business |
Zdroj: | Journal of Materials Science: Materials in Electronics. 32:17780-17790 |
ISSN: | 1573-482X 0957-4522 |
DOI: | 10.1007/s10854-021-06314-6 |
Popis: | The present work aims at the characterization of SrFe12O19 prepared by nitrate route and its photo-electrochemical properties as well as its application for the photodegradation of Basic Red 46 (BR 46), a hazardous and persistent dye. The semiconductor is identified by X-ray diffraction to confirm the single phase. The scanning electron microscopic indicates regular grains with spherical shapes and an average dimension of ~ 0.9 µm. The optical properties were measured by the diffuse reflectance and a direct gap of 2.56 eV was determined. The photo-electrochemistry enables us to determine the conduction type. SrFe12O19 is an n-type semiconductor with a flat band potential of − 0.42 VSCE. The second part of this work is devoted to the BR 46 photodegradation on the hetero-system SrFe12O19/ZnO under visible irradiation. The effect of pH, BR 46 initial concentration, catalyst dose and mass ratio of the hetero-system SrFe12O19/ZnO were studied. The best degradation yield occurs at neutral pH ~ 7 within 90 min with a percentage of 99% for BR 46 concentration of 10 mg/L and a ratio SrFe12O19/ZnO (75/25) and a catalyst dose of 0.75 g/L. The photoelectrochemical properties show that ·OH radicals are responsible for the BR 46 degradation. |
Databáze: | OpenAIRE |
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