P-141L:Late-News Poster: Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors
Autor: | Mun-Soo Park, Dongsik Kong, Dae Hwan Kim, Sunwoong Choi, Jaehyeong Kim, Minkyung Bae, Dong Myong Kim, Moon-Hyun Yoo, Hyun Kwang Jeong, Keum-Dong Jung, Inseok Hur, Woojoon Kim, Yongsik Kim |
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Rok vydání: | 2012 |
Předmět: | |
Zdroj: | SID Symposium Digest of Technical Papers. 43:1133-1136 |
ISSN: | 0097-966X |
Databáze: | OpenAIRE |
Externí odkaz: |