Measurement of the nonlinear optical properties of semiconductors using the irradiance scan technique

Autor:	Joel M. Murray, Leonel P. Gonzalez, Vincent M. Cowan, Shekhar Guha
Rok vydání:	2008
Předmět:	Nonlinear absorption Materials science business.industry Physics::Medical Physics Irradiance Nonlinear optics Refraction Two-photon absorption Cadmium telluride photovoltaics Condensed Matter::Materials Science Optics Semiconductor business Absorption (electromagnetic radiation)
Zdroj:	Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII.
ISSN:	0277-786X
Popis:	Irradiance scan measurements of the nonlinear absorption and refraction coefficients of CdTe were performed at room temperature and at 77 K and compared to the values obtained in previous experiments using a different technique.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::10d438cb68038f7762aaf090b00deb42 https://doi.org/10.1117/12.763152 Zobrazit plný text záznamu