Measurement of the nonlinear optical properties of semiconductors using the irradiance scan technique
Autor: | Joel M. Murray, Leonel P. Gonzalez, Vincent M. Cowan, Shekhar Guha |
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Rok vydání: | 2008 |
Předmět: | |
Zdroj: | Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII. |
ISSN: | 0277-786X |
Popis: | Irradiance scan measurements of the nonlinear absorption and refraction coefficients of CdTe were performed at room temperature and at 77 K and compared to the values obtained in previous experiments using a different technique. |
Databáze: | OpenAIRE |
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