Compact representation of temperature and power dependence of thermal resistance in Si, Inp and GaAs substrate devices using linear models
| Autor: | T.W. MacElwee, D.J. Walkey, Tom J. Smy, M.C. Maliepaard |
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| Rok vydání: | 2002 |
| Předmět: |
Materials science
business.industry Thermal resistance Substrate (electronics) Dissipation Atmospheric temperature range Condensed Matter Physics Thermal conduction Electronic Optical and Magnetic Materials Thermal conductivity Materials Chemistry Electronic engineering Optoelectronics Electrical and Electronic Engineering Thermal analysis business Scaling |
| Zdroj: | Solid-State Electronics. 46:819-826 |
| ISSN: | 0038-1101 |
| DOI: | 10.1016/s0038-1101(01)00340-9 |
| Popis: | A general model for the dependence of integrated device thermal resistance on substrate backside temperature and power dissipation for Si, InP and GaAs substrates is derived by consideration of the role of temperature dependent thermal conductivity in each of these effects. Linearization of these model components is carried out to extract computationally simple expressions that retain very close agreement to the full equations. A parameter extraction and scaling procedure is developed which allows the linearized models to be used in a practical modeling environment. The performance of extracted and scaled model parameters in predicting thermal resistance is compared to measurements for InP substrate devices, and the agreement and predictions are found to be within 5% of measurements for two geometries, for power levels to 3 mW/μm 2 and over a 165 °C substrate temperature range. The InP device model is also implemented as a subcircuit in hspice using behavioral sources, and the results confirmed with circuit simulation. |
| Databáze: | OpenAIRE |
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