Autor: |
Guo Xiang Hu, Zheng Yuan Zhang, Zhi Cheng Feng, Jian Gen Li, Yong Mei, Xiao Gang Li |
Rok vydání: |
2011 |
Předmět: |
|
Zdroj: |
Advanced Materials Research. 339:92-95 |
ISSN: |
1662-8985 |
DOI: |
10.4028/www.scientific.net/amr.339.92 |
Popis: |
Aiming at the severe effect of poly-silicon deposition process on the performance of semiconductor bridge, experiments were made on optimization of poly-silicon deposition to obtain optimal process conditions. Resistance of the poly-silicon semiconductor bridge was stabilized 1±0.07Ω, satisfying its application requirements. |
Databáze: |
OpenAIRE |
Externí odkaz: |
|