Resonance-Enhanced Multiphoton Ionization Study of NO Scattering from a Corrugated Si(100) Surface with Oxygen Coverage

Autor:	Tatsuya Miyake, T. Suzaki, Masahiro Sakai, Hideto Kamba, Akira Namiki, Tetsurou Nakamura, Hiroyuki S. Kato
Rok vydání:	1991
Předmět:	Surface (mathematics) Resonance-enhanced multiphoton ionization chemistry Scattering Ionization General Engineering General Physics and Astronomy chemistry.chemical_element Specular reflection Inelastic scattering Atomic physics Oxygen Energy (signal processing)
Zdroj:	Japanese Journal of Applied Physics. 30:349
ISSN:	1347-4065 0021-4922
DOI:	10.1143/jjap.30.349
Popis:	The resonance-enhanced multiphoton ionization (REMPI) technique has been used to probe the dynamics of NO scattering from oxygen-covered Si(100) as a function of incident beam energy E i and incident angle θi. A direct inelastic scattering process as well as a trapping-desorption process was observed to occur even for the lowest incident energy available in our apparatus, 0.09 eV. Considerable loss in the peak velocity was found to be E i-dependent for the direct inelastic component scattered at the specular angle. The angular width of the scattering lobe increased with increasing E i. These facts are qualitatively explained in terms of the surface corrugation.
Databáze:	OpenAIRE
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