Test Algorithm and Diagnosis Implementation for Embedded SRAM

Autor:	You-Ren Wang, Ze-Wang Chen, Jian-Hua Su
Rok vydání:	2010
Předmět:	Computer science business.industry Test algorithm Embedded system Static random-access memory business Computer Graphics and Computer-Aided Design Software
Zdroj:	Journal of Computer-Aided Design & Computer Graphics. 22:865-870
ISSN:	1003-9775
DOI:	10.3724/sp.j.1089.2010.10715
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1062c458fa5e30645dc925de484cf588 https://doi.org/10.3724/sp.j.1089.2010.10715 Zobrazit plný text záznamu