| Autor: |
Zhu Jiawei, Li Qian, Pan Guangze, Yaqiu Li, Xiaobing Li, Lei Baimao |
| Rok vydání: |
2018 |
| Předmět: |
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| Zdroj: |
2018 12th International Conference on Reliability, Maintainability, and Safety (ICRMS). |
| DOI: |
10.1109/icrms.2018.00084 |
| Popis: |
Failure mechanisms are the root cause of product failure, and describes the internal physical and chemical process during a products' lifetime, reflecting the relationship between internal variables and product life under specific circumstances. By modelling the failure mechanism of parts or components, designers can quantify the reliability of device-level and predict remaining lifespan without requiring abundant history failure data. This is significant in developing the failure mechanism modelling method for the use in system failures. Based on the physics of failure, this study proposes a system level reliability evaluation framework which considers the physics of failure mechanisms, and describes an evaluation method based on Bayesian inference, which was tested using typical threshold dynamic parameters of system failure. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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