Single event transients generation in silicon devices with pulsed laser

Autor:	Jaume Segura, Ivan de Paul, Franco N. Bandi, Sebastia Bota
Rok vydání:	2015
Předmět:	Pulsed laser Materials science Silicon business.industry Event (computing) Silicon photodiode chemistry.chemical_element Transient analysis Photodiode law.invention Semiconductor laser theory chemistry law Optoelectronics business
Zdroj:	2015 10th Spanish Conference on Electron Devices (CDE).
Popis:	We perform a comparative study of the characteristics and capabilities of a pulsed laser system that emulates single event injection available at the UIB with respect to similar pulsed laser test facilities in Europe (EADS, IMS) and the United States (JPL, NRL). A series of experimental measurements were taken on a silicon photodiode (Centronic OSD15-5T) used in a previous comparative study conducted by the mentioned centers.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::103c94fc2b4c7dcc346bd5081b0d2d77 https://doi.org/10.1109/cde.2015.7087497 Zobrazit plný text záznamu