Industrial relevance of deep junctions produced by rapid thermal processing for power integrated circuits

Autor: Christian Ganibal, J.-M. Dilhac, L. Cornibert, S. Roux, Benjamin Morillon
Rok vydání: 2003
Předmět:
Zdroj: 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312).
DOI: 10.1109/ispsd.1999.764107
Popis: An alternative method for creating total vertical junction insulation for power devices is presented. It involves the thermomigration of molten Al/Si. First, the method is theoretically detailed. A full description of the equipment required for this task is then given with special emphasis on the specific characteristics needed. Physical and electrical results are briefly discussed, showing the efficiency of the method in terms of surface consumption and voltage handling capability. Finally, application of thermomigration to a manufacturing environment is considered.
Databáze: OpenAIRE