Physicochemical assessment criteria for high-voltage pulse capacitors
| Autor: | L. A. Darian, L. Kh. Lam |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Physics Nuclear and High Energy Physics Hardware_PERFORMANCEANDRELIABILITY 01 natural sciences High voltage pulse Atomic and Molecular Physics and Optics Automotive engineering First generation Third generation Pulse (physics) law.invention Capacitor Remaining life Hardware_GENERAL law 0103 physical sciences Service life Hardware_INTEGRATEDCIRCUITS Three generations |
| Zdroj: | Physics of Atomic Nuclei. 79:1585-1589 |
| ISSN: | 1562-692X 1063-7788 |
| Popis: | In the paper, the applicability of decomposition products of internal insulation of high-voltage pulse capacitors is considered (aging is the reason for decomposition products of internal insulation). Decomposition products of internal insulation of high-voltage pulse capacitors can be used to evaluate their quality when in operation and in service. There have been three generations of markers of aging of insulation as in the case with power transformers. The area of applicability of markers of aging of insulation for power transformers has been studied and the area can be extended to high-voltage pulse capacitors. The research reveals that there is a correlation between the components and quantities of markers of aging of the first generation (gaseous decomposition products of insulation) dissolved in insulating liquid and the remaining life of high-voltage pulse capacitors. The application of markers of aging to evaluate the remaining service life of high-voltage pulse capacitor is a promising direction of research, because the design of high-voltage pulse capacitors keeps stability of markers of aging of insulation in high-voltage pulse capacitors. It is necessary to continue gathering statistical data concerning development of markers of aging of the first generation. One should also carry out research aimed at estimation of the remaining life of capacitors using markers of the second and the third generation. |
| Databáze: | OpenAIRE |
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