Interferometric Scattering Microscopy with Polarization-Selective Dual Detection Scheme: Capturing the Orientational Information of Anisotropic Nanometric Objects
| Autor: | Il Buem Lee, Hyeon Min Moon, Jong Hyeon Joo, Kyoung Hoon Kim, Seok Cheol Hong, Minhaeng Cho |
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| Rok vydání: | 2017 |
| Předmět: |
0301 basic medicine
Materials science business.industry Scattering 02 engineering and technology 021001 nanoscience & nanotechnology Polarization (waves) Atomic and Molecular Physics and Optics Interference microscopy Electronic Optical and Magnetic Materials law.invention 03 medical and health sciences Interferometry 030104 developmental biology Optics Optical microscope law Microscopy Electrical and Electronic Engineering 0210 nano-technology business Anisotropy Nanoscopic scale Biotechnology |
| Zdroj: | ACS Photonics. 5:797-804 |
| ISSN: | 2330-4022 |
| Popis: | Single-particle tracking is a powerful technique to reveal an underlying principle of microscopic phenomena. Here we report an optical microscopy technique, polarization-selective interferometric scattering microscopy, that enables us to capture rotational as well as positional information on nanoscale objects. This technique grants all the merits of interferometric scattering microscopy and provides a further advantage of the capability of determining the orientation of single nanoscopic objects in a straightforward and facile way. We anticipate that this technique would be of critical use in rotational tracking of a single anisotropic particle or biological system in the nanoscopic world. |
| Databáze: | OpenAIRE |
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