Application of stereomicroscope and CCD imaging system to spot size measurement of high-order Bessel beam

Autor:	陈姿言 Chen Ziyan, 何西 He Xi, 沈栋辉 Shen Donghui, 吴逢铁 Wu Fengtie
Rok vydání:	2014
Předmět:	Physics Optics business.industry Stereo microscope Bessel beam Electrical and Electronic Engineering High order Size measurement business Atomic and Molecular Physics and Optics
Zdroj:	High Power Laser and Particle Beams. 26:111006
ISSN:	1001-4322
DOI:	10.3788/hplpb20142611.111006
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1016c41bb6bc8b9cbf70cf12315375c3 https://doi.org/10.3788/hplpb20142611.111006 Zobrazit plný text záznamu