| Popis: |
A mathematical model for general manufacturing test strategies is described in a companion paper in this issue. Any given test strategy, or test and repair network, is represented as a directed graph with various node attributes. The nodes represent test and repair stations with attributes pertaining to accuracy, effectiveness, time, and costs; edges represent potential flow between the stations. In this paper we describe a preliminary software system based on the structure described. Such a system can be used as a test strategy evaluator that allows the explicit computation of incurred test costs and expected field return rates and allows for the investigation of trade-offs between the two. By using practical insights into the testing process, the computational complexity of the implemented algorithm has been reduced to polynomial. Several examples are then presented to illustrate the flexibility of the model and software. © 2007 Alcatel-Lucent. |
Plný text