Cryogenic Near-Field Imaging and Spectroscopy at the 10-Nanometer-Scale

Autor:	Max Eisele, Tobias Gokus, Andreas J. Huber
Rok vydání:	2018
Předmět:	Materials science business.industry Near-field optics Cryogenics law.invention Semiconductor Optical microscope law Microscopy Optoelectronics Near-field scanning optical microscope Nanometre Spectroscopy business
Zdroj:	Conference on Lasers and Electro-Optics.
DOI:	10.1364/cleo_qels.2018.fth1k.4
Popis:	We extend conventional near-field microscopy at ambient conditions to the cryogenic temperature range (
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0fd0585af2930b9948e93b6a862c5ad1 https://doi.org/10.1364/cleo_qels.2018.fth1k.4 Zobrazit plný text záznamu