Yield Methodology and Learning in Phase Change Memory (PCM) technology for Analog Computing : Topic/category: YE: Yield Enhancement/Learning, YM: Yield Methodologies

Autor:	Victor Chan, A. Gasasira, R. Pujari, R. Southwick, I. Ok, S. Choi, C. Silvestre, G. W. Burr, N. Saulnier, S. Teehan, I. Ahsan
Rok vydání:	2022
Zdroj:	2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
DOI:	10.1109/asmc54647.2022.9792478
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0fca00339d32a09bf0677a305ccb3fda https://doi.org/10.1109/asmc54647.2022.9792478 Zobrazit plný text záznamu