Autor: |
C.-H. Kwak, Chang-In Park, Soon-Jae Kim, Seung-A Han, B.-H. Kim, S.-Y. Seo, Sang-Hong Park |
Rok vydání: |
2010 |
Předmět: |
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Zdroj: |
Journal of Crystal Growth. 312:2093-2097 |
ISSN: |
0022-0248 |
DOI: |
10.1016/j.jcrysgro.2010.04.033 |
Popis: |
High quality Zn 1− x Fe x O thin films were deposited on α -sapphire substrates by RF magnetron sputtering. X-ray absorption fine structure measurements showed that the chemical valence of Fe ions in the films was a mixture of 2+ and 3+ states, and Fe ions substituted mainly for the Zn sites in the films. DC-magnetization measurements revealed ferromagnetic properties from 5 to 300 K. The photoluminescence measurements at 15 K showed a sharp main transition peak at 3.35 eV along with a broad impurity peak at 2.45 eV. The structural and magnetization analyses of the Zn 1− x Fe x O films strongly suggested that the ferromagnetism was the intrinsic properties of the films. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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