| Popis: |
This paper is motivated by the need for a generic approach to evaluate the volumetric accuracy of rapid prototyping (RP) machines. The approach presented in this paper is inspired in large part by the techniques developed over the years for the parametric evaluation of coordinate measuring machine (CMM) errors. In CMM metrology, the parametric error functions for the machine are determined by actual measurement of a master reference artifact with known characteristics. In our approach, the RP machine is used to produce a generic artifact, which is then measured by a master CMM, and measurement results are used to infer the RP machine's parametric error functions. The results presented demonstrate the feasibility of such an approach on a two‐dimensional model. |
