Layout Hotspot Pattern Clustering Using a Density-based Approach

Autor: Ciao-Syun Lin, Pin-Yian Tsai, Yan-Hsiu Liu, Yi-Ting Li, Yung-Chih Chen, Chun-Yao Wang
Rok vydání: 2023
Zdroj: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT).
DOI: 10.1109/vlsi-tsa/vlsi-dat57221.2023.10133968
Databáze: OpenAIRE