System-Independent Characterization of Materials Using Dual-Energy Computed Tomography
| Autor: | Kyle Champley, Daniel J. Schneberk, Maurice B. Aufderheide, Jeffrey S. Kallman, Stephen G. Azevedo, G. Patrick Roberson, William D. Brown, Isaac M. Seetho, Harry E. Martz, Jerel A. Smith |
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| Rok vydání: | 2016 |
| Předmět: |
Physics
Discrete mathematics Nuclear and High Energy Physics Accuracy and precision Electron density medicine.diagnostic_test Spectral response Dual-Energy Computed Tomography Computed tomography 02 engineering and technology 021001 nanoscience & nanotechnology Spectral line 030218 nuclear medicine & medical imaging 03 medical and health sciences 0302 clinical medicine Nuclear Energy and Engineering medicine Electrical and Electronic Engineering 0210 nano-technology Effective atomic number |
| Zdroj: | IEEE Transactions on Nuclear Science. 63:341-350 |
| ISSN: | 1558-1578 0018-9499 |
| Popis: | We present a new decomposition approach for dual-energy computed tomography (DECT) called SIRZ that provides precise and accurate material description, independent of the scanner, over diagnostic energy ranges (30 to 200 keV). System independence is achieved by explicitly including a scanner-specific spectral description in the decomposition method, and a new X-ray-relevant feature space. The feature space consists of electron density, ${\rho _{\rm e}}$ , and a new effective atomic number, ${{\rm Z}_{\rm e}}$ , which is based on published X-ray cross sections. Reference materials are used in conjunction with the system spectral response so that additional beam-hardening correction is not necessary. The technique is tested against other methods on DECT data of known specimens scanned by diverse spectra and systems. Uncertainties in accuracy and precision are less than 3% and 2% respectively for the ( ${\rho _{\rm e}}$ , ${{\rm Z}_{\rm e}}$ ) results compared to prior methods that are inaccurate and imprecise (over 9%). |
| Databáze: | OpenAIRE |
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