Secondary ion mass spectrometry for superconducting radiofrequency cavity materials
| Autor: | Uttar Pudasaini, C. E. Reece, Michael J. Kelley, Jay Tuggle, Ari Palczewski, Fred A. Stevie |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
02 engineering and technology 01 natural sciences law.invention Secondary Ion Mass Spectroscopy Characterization methods Material structure law 0103 physical sciences Materials Chemistry Electrical and Electronic Engineering 010306 general physics Process engineering Instrumentation Superconductivity business.industry Process Chemistry and Technology Superconducting radio frequency Particle accelerator 021001 nanoscience & nanotechnology Research process Surfaces Coatings and Films Electronic Optical and Magnetic Materials Secondary ion mass spectrometry 0210 nano-technology business |
| Zdroj: | Journal of Vacuum Science & Technology B. 36:052907 |
| ISSN: | 2166-2754 2166-2746 |
| DOI: | 10.1116/1.5041093 |
| Popis: | Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here, one such method, secondary ion mass spectrometry (SIMS), is discussed with focus on the analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of material-based SRF technologies.Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here, one such method, secondary ion mass spectrometry (SIMS), is discussed with focus on the analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of material-based SRF technologies. |
| Databáze: | OpenAIRE |
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