PbTiO3 epitaxial thin films as optical waveguides

Autor:	X. Lansiaux, Elhadj Dogheche, Denis Remiens, B. Jaber
Rok vydání:	1998
Předmět:	Materials science business.industry General Physics and Astronomy Substrate (electronics) Atmospheric temperature range Epitaxy chemistry.chemical_compound Full width at half maximum Optics chemistry Sputtering Optoelectronics Lead titanate Thin film business Refractive index
Zdroj:	Le Journal de Physique IV. :Pr9-277
ISSN:	1155-4339
DOI:	10.1051/jp4:1998955
Popis:	Thin films of lead titanate (PbTiO 3 -PT) have been prepared in-situ on SrTiO 3 (100) substrates using radio-frequency sputtering. The epitaxial quality of the films has been investigated as a function of the substrate temperature. Stoichiometric films have been obtained in the temperature range 550°C-600°C. Films have a high degree of c-axis oriented crystalline structure. The optimum conditions for growing epitaxial PbTiO 3 layers are reported in this study. Thin films grown at 550°C exhibited a rocking curve full width at a half maximum (FWHM) of 0.26°. The refractive index calculated from optical transmission method has been evaluated to 2.61 @ 632.8nm. which represents 98% of the corresponding bulk material.
Databáze:	OpenAIRE
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