InGaN/GaN double heterostructure laser with cleaved facets

Autor: Jeffrey S. Flynn, Vivek M. Phanse, Karim S. Boutros, W. Grieshaber, Joan M. Redwing, Robert P. Vaudo, Dean A. Stocker, Erdmann Frederick Schubert
Rok vydání: 1998
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.304461
Popis: Laser action is demonstrated in InGaN/GaN double heterostructures with cleaved facets. Hydride vapor phase epitaxy is used to grow a 10-micrometer-thick buffer layer of GaN on (0001) sapphire, and metal-organic vapor phase epitaxy is used to subsequently grow a GaN/In 0.09 Ga 0.91 N/GaN double heterostructure. One-mm-long cavities are produced by cleaving the structure along the (1010) plane of the sapphire substrate. A pulsed Nitrogen laser is used for optical excitation. At room temperature, the laser threshold occurs at an incident power density of 1.3 MW/cm 2 . Above threshold, the differential quantum efficiency increases by a factor of 34, the emission linewidth decreases to 13.5 meV, and the output becomes highly TE polarized.
Databáze: OpenAIRE