Polystyrene-silicon bonding through π electrons: a combined XPS and DFT study
| Autor: | John F. Watts, Marie-Laure Abel, Robert H. Carr, Sabrina Tardio |
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| Rok vydání: | 2015 |
| Předmět: |
Materials science
Silicon Binding energy Analytical chemistry chemistry.chemical_element 02 engineering and technology Surfaces and Interfaces General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics Ring (chemistry) 01 natural sciences Molecular electronic transition 0104 chemical sciences Surfaces Coatings and Films Silanol chemistry.chemical_compound X-ray photoelectron spectroscopy chemistry Materials Chemistry Physical chemistry Molecular orbital Polystyrene 0210 nano-technology |
| Zdroj: | Surface and Interface Analysis. 48:556-560 |
| ISSN: | 0142-2421 |
| Popis: | Silicon wafers, covered with different thickness layers of polystyrene, were analysed by XPS. High resolution spectra of the C1s shake-up satellite, due to the π-π* transition of the aromatic ring, were compared. A shift in the shake-up binding energy represents a change in the electronic transition energy and so in the energy of the molecular orbital. This made it possible to assess and confirm an interaction between the π electrons of the phenyl ring and the silanol groups present on the surface of the silicon. Copyright © 2015 John Wiley & Sons, Ltd. |
| Databáze: | OpenAIRE |
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