Picosecond Time-resolved X-ray Diffraction from Photo-excited Semiconductors

Autor:	Ken-ichi Kondo, Hiroaki Kishimira, Yasuhisa H. Okano, Kazutaka G. Nakamura, Yoichiro Hironaka
Rok vydání:	2005
Předmět:	Materials science Semiconductor business.industry Picosecond Excited state X-ray crystallography Atomic physics business
Zdroj:	The Review of Laser Engineering. 33:8-9
ISSN:	1349-6603 0387-0200
DOI:	10.2184/lsj.33.8
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0ea1c1641cc92c077e69a4eb6187865d https://doi.org/10.2184/lsj.33.8 Zobrazit plný text záznamu