| Autor: |
Dave Albert, Tracy Meyers |
| Rok vydání: |
2022 |
| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| DOI: |
10.31399/asm.cp.istfa2022tpa1 |
| Popis: |
This presentation provides an overview of the terminology and concepts associated with semiconductor yield analysis, modeling, and improvement techniques. It compares and contrasts yield models and describes the steps and equipment involved in setting up yield engineering programs targeting specific failures and defects. It also includes case histories showing how different yield analysis models have been used to identify the root cause of random and systematic failures. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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