Distorted iron films onGaAs(001)−(4×6)
| Autor: | E. D. Crozier, Theodore L. Monchesky, B. Heinrich, D.T. Jiang, Robert A. Gordon |
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| Rok vydání: | 2000 |
| Předmět: | |
| Zdroj: | Physical Review B. 62:2151-2157 |
| ISSN: | 1095-3795 0163-1829 |
| Popis: | Polarized K-edge x-ray absorption fine structure spectroscopy (XAFS) studies were performed both in and ex situ on iron films deposited on GaAs substrates. Samples with 5 and 10 ML (monolayers) of iron deposited on sulfur-passivated and $(4\ifmmode\times\else\texttimes\fi{}6)$-reconstructed GaAs(001) surfaces, respectively, were studied ex situ (capped with 20 ML of gold) and compared with 9.3 ML on $\mathrm{GaAs}(001)\ensuremath{-}(4\ifmmode\times\else\texttimes\fi{}6)$ measured in situ. Analysis of XAFS spectra for both samples on $(4\ifmmode\times\else\texttimes\fi{}6)\ensuremath{-}\mathrm{GaAs}$ reveals a tetragonal distortion of the iron film relative to bulk body-centered-cubic iron. The distortion involves an in-plane contraction and an expansion perpendicular to the GaAs surface to give a $c/a$ ratio of 1.03(1), with a comparable to half the bulk lattice constant of GaAs. The sample on sulfur-passivated GaAs did not exhibit this distortion. |
| Databáze: | OpenAIRE |
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