Investigation of the Surface Properties of Graphene Oxide and Graphene by Inverse Gas Chromatography
Autor: | Guojian Wang, Dai Jinfeng, Wu Chengken |
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Rok vydání: | 2013 |
Předmět: | |
Zdroj: | Chromatographia. 77:299-307 |
ISSN: | 1612-1112 0009-5893 |
DOI: | 10.1007/s10337-013-2597-1 |
Popis: | The surface properties of graphene oxide (GO) and graphene (rGO) have been investigated for the first time using inverse gas chromatography at infinite dilution. The GO and rGO were prepared by classical Hummers method and chemical reduction method, respectively, and their structures were characterized using FT-IR, XDR, XPS, SEM, and TEM. It is found that their dispersive (\( \gamma_{\text{s}}^{\text{D}} \)), polar (\( \gamma_{\text{s}}^{\text{P}} \)), and total (\( \gamma_{\text{s}}^{\text{T}} \)) surface energies were 28.5, 18.0, 46.5 mJ m−2 and 98.3, 6.60, 104.9 mJ m−2 at 313.15 K, respectively. The results indicate that these samples differ in their surface properties, due to their structure (existence of oxygen-containing functional groups, of defects). By referencing the empirical relationship to establishing the donor (KD) and acceptor (KA) interaction parameters of the various samples, the Lewis acid–base character of the surface can be reliably identified. As a result, it is revealed that GO is a Lewis-base material, whereas rGO tends to be amphoteric but is also a Lewis-base material. Evaluation of surface properties of graphene could be used to guide the processing and application in graphene-based nanocomposites in the future. |
Databáze: | OpenAIRE |
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