Predamage Threshold Electron Emission from Insulator and Semiconductor Surfaces

Autor:	WJ Siekhaus, D Milam, J. H. Kinney
Rok vydání:	2008
Předmět:	Physics Physics::Instrumentation and Detectors Band gap business.industry Astrophysics::High Energy Astrophysical Phenomena Physics::Optics Thermionic emission Electron Fluence Electromagnetic radiation Semiconductor Ionization Atomic physics business Astrophysics::Galaxy Astrophysics Excitation
DOI:	10.1520/stp28999s
Popis:	Predamage electron emission shows a dependence on fluence, bandgap and wavelength consistent with multiphoton excitation across the bandgap and inconsistent with avalanche ionization and thermionic emission models. The electron emission scales with pulselength as 1/..sqrt..T. 6 references, 8 figures, 1 table.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0e0962d481e3b916be3e944bf9534048 https://doi.org/10.1520/stp28999s Zobrazit plný text záznamu