Electrical Characterization of Large Area 800 V Enhancement-Mode SiC VJFETs for High Temperature Applications

Autor: Volodymyr Bondarenko, David C. Sheridan, Robin L. Kelley, Andrew Ritenour
Rok vydání: 2009
Předmět:
Zdroj: Materials Science Forum. :715-718
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/msf.615-617.715
Popis: Prototype 800 V, 47 A enhancement-mode SiC VJFETs have been developed for high temperature operation (250 °C). With an active area of 23 mm2 and target threshold voltage of +1.25 V, these devices exhibited a 28 m room temperature on-resistance and excellent blocking characteristics at elevated temperature. With improved device packaging, on-resistance and saturation current values of 15 m and 100 A, respectively, are achievable.
Databáze: OpenAIRE