Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions (Conference Presentation)

Autor:	Peter K. Petrov, Anna Regoutz, Takayuki Matsui, Stefan A. Maier, Andrei P. Mihai, Nicholas A. Güsken, Brock Doiron, Lesley F. Cohen, Ryan Bower, Yi Li, Rupert F. Oulton, Alberto Lauri
Rok vydání:	2020
Předmět:	Materials science genetic structures business.industry Oxide Titanium nitride Metal chemistry.chemical_compound chemistry visual_art Titanium dioxide visual_art.visual_art_medium Optoelectronics sense organs Photonics business Metal thin film
Zdroj:	Silicon Photonics XV.
DOI:	10.1117/12.2546034
Popis:	This Conference Presentation, "Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions" was recorded at Photonics West 2020 held in San Francisco, California, United States.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0dcbc3dc5d32ccba37986de83c90112a https://doi.org/10.1117/12.2546034 Zobrazit plný text záznamu