A refractometric sensor using index-sensitive mode resonance between single-mode fiber and thin film amorphous silicon waveguide
| Autor: | E. Vlaikova, Andrey Andreev, P. Danesh, B. Pantchev, B. S. Zafirova, E. Alipieva, E.I. Karakoleva |
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| Rok vydání: | 2005 |
| Předmět: |
Amorphous silicon
Mode volume Materials science business.industry Metals and Alloys Single-mode optical fiber Polarization-maintaining optical fiber Condensed Matter Physics Graded-index fiber Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry.chemical_compound Optics chemistry Fiber optic sensor Materials Chemistry Dispersion-shifted fiber Electrical and Electronic Engineering Radiation mode business Instrumentation |
| Zdroj: | Sensors and Actuators B: Chemical. 106:484-488 |
| ISSN: | 0925-4005 |
| Popis: | A waveguide structure consisting of a side-polished single-mode polarization maintaining (PM) fiber and amorphous silicon film on top was applied for “in situ” control of the amorphous silicon deposition process. The changes in the fiber output intensities resulting from the film thickness growing were measured. The interaction of the fiber mode and TE0 and TE1 planar waveguide (PWG) modes was investigated. The applicability of the structure as a high sensitive refractometric sensor element was demonstrated. |
| Databáze: | OpenAIRE |
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