Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP
| Autor: | Yu-hao Chen, William A. Radasky, Yan-zhao Xie, Leonid N. Zdoukhov, Vladimir Chepelev, Yury Parfenov, Boris A. Titov, Ke-Jie Li, Xu Kong |
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| Rok vydání: | 2018 |
| Předmět: |
Electromagnetic field
Network packet Computer science Joule 020206 networking & telecommunications 02 engineering and technology Pulse (physics) Power (physics) Hardware_GENERAL 0202 electrical engineering electronic engineering information engineering Electronic engineering Electronics Electrical and Electronic Engineering Energy (signal processing) Electronic circuit |
| Zdroj: | Journal of Electronic Testing. 34:547-557 |
| ISSN: | 1573-0727 0923-8174 |
| DOI: | 10.1007/s10836-018-5749-2 |
| Popis: | In this paper, we have considered a methodical approach to forecast the consequences of the influence of pulsed electromagnetic fields on electronic devices based on three defined conditions of the disruption of device functioning. The approach is based on the use of key parameters of pulse disturbances in critical circuits of electronic devices. Depending on the problem being solved and features of the object being tested, the key parameters can be: the amplitude of a voltage pulse in a critical circuit of an object; the Joule integral; the energy; the frequency of repetition of influencing pulses; the probability of a bit error; the number of errors in a transferred data packet; the data rate, etc. |
| Databáze: | OpenAIRE |
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