Chemical analysis using X-ray and electron spectroscopies

Autor:	C. Esnouf
Rok vydání:	2003
Předmět:	Auger electron spectroscopy Chemistry Astrophysics::High Energy Astrophysical Phenomena Electron energy loss spectroscopy Materials Chemistry Metals and Alloys X-ray Analytical chemistry Electron Physical and Theoretical Chemistry Condensed Matter Physics Spectroscopy
Zdroj:	Revue de Métallurgie. 100:495-506
ISSN:	1156-3141 0035-1563
DOI:	10.1051/metal:2003219
Popis:	This paper is mainly devoted to the presentation and the illustration of chemical microananalysis methods. Four basic techniques will be successively presented: the energy dispersive X-rays spectroscopy (EDS), the wave dispersive spectroscopy of X-rays (WDS), the electron energy loss spectroscopy (EELS) and the Auger spectroscopy (AES). For each of them, the limitations and advantages will be presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0d5fe0e5ea260237b0cd1fbe15631bce https://doi.org/10.1051/metal:2003219 Zobrazit plný text záznamu