XPS analysis of IAD fluoride films
| Autor: | Charles M. Kennemore, Ursula J. Gibson |
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| Rok vydání: | 1986 |
| Zdroj: | Annual Meeting Optical Society of America. |
| DOI: | 10.1364/oam.1986.mq2 |
| Popis: | Investigation of the core electron binding energies by x-ray photoelectron spectroscopy (XPS) allows the determination not only of the elemental composition of the film but also the detection of the various compounds of the constituent elements due to the measurable shift in the electron binding energies associated with chemical bonding. |
| Databáze: | OpenAIRE |
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