Page Type-Aware Data Migration Technique for Read Disturb Management of NAND Flash Memory

Autor:	Sangwoo Han, Minjung Cho, Gi Lee, Eui-Young Chung
Rok vydání:	2023
Předmět:	Hardware and Architecture Electrical and Electronic Engineering Software
Zdroj:	IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 31:591-595
ISSN:	1557-9999 1063-8210
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0cb90c70748d29b96986d8844eadec86 https://doi.org/10.1109/tvlsi.2023.3240172 Zobrazit plný text záznamu