Heterogeneous Deformation by Microscopic Moiré Interferometry

Autor:	Annalisa Malfatto, Gianni Nicoletto
Rok vydání:	2001
Předmět:	Optics Materials science Mechanics of Materials business.industry Fringe pattern Mechanical Engineering Electronic speckle pattern interferometry General Materials Science Deformation (meteorology) business Moire interferometry
Zdroj:	Key Engineering Materials. :355-362
ISSN:	1662-9795
DOI:	10.4028/www.scientific.net/kem.221-222.355
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0c99879a56e7b5ca3272f0f6364584b1 https://doi.org/10.4028/www.scientific.net/kem.221-222.355 Zobrazit plný text záznamu