| Autor: |
V. Abramzon, R. Pasha, M. Martin, S. Ray, A. Al-Adnani, Peter Brandt, Brian D. Setterberg, D. J. Huber, Kenneth D. Poulton, Annemie Jacobs, Gunter Steinbach, M. Clayson, John Patrick Keane, Bernd Wuppermann, E. Peeters, F. Demarsin |
| Rok vydání: |
2013 |
| Předmět: |
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| Zdroj: |
ISSCC |
| DOI: |
10.1109/isscc.2013.6487817 |
| Popis: |
Metastable events in ADC comparators cause large errors that cannot be tolerated in test and measurement applications that record data over extended time intervals. This work utilizes BiCMOS technology to provide high dynamic range analog-to-digital conversion at 2.5GS/s with a metastable error rate of less than one error per year and better than 78dB SFDR over a 1GHz BW. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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