Measurement of energy penetration depth of subpicosecond laser energy into solid density matter
Autor: | D. J. Nagel, A. McPherson, C. K. Rhodes, P. G. Burkhalter, Arie Zigler, George N. Gibson, M. D. Rosen, Keith Boyer, Ting S. Luk |
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Rok vydání: | 1991 |
Předmět: | |
Zdroj: | Applied Physics Letters. 59:534-536 |
ISSN: | 1077-3118 0003-6951 |
Popis: | The energy penetration depth characteristic of the interaction of intense subpicosecond (∼600 fs) ultraviolet (248 nm) laser radiation with solid density material has been experimentally determined. This was accomplished by using a series of ultraviolet transmitting targets consisting of a fused silica (SiO2) substrate coated with an 80–600 nm layer of MgF2. The measurement of He‐like and H‐like Si and Mg lines, as a function of MgF2 thickness, enabled the determination of the energy penetration depth. It was found that this depth falls in the range of 250–300 nm for a laser intensity of ∼3×1016 W/cm2. Based on numerical simulations, it is estimated that solid density material to a depth of ∼250 nm is heated to an electron temperature of ∼500 eV. |
Databáze: | OpenAIRE |
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