Measurement of energy penetration depth of subpicosecond laser energy into solid density matter

Autor:	D. J. Nagel, A. McPherson, C. K. Rhodes, P. G. Burkhalter, Arie Zigler, George N. Gibson, M. D. Rosen, Keith Boyer, Ting S. Luk
Rok vydání:	1991
Předmět:	Range (particle radiation) Physics and Astronomy (miscellaneous) Chemistry business.industry Substrate (electronics) Radiation medicine.disease_cause Laser Electromagnetic radiation Molecular physics law.invention Optics law medicine Electron temperature Penetration depth business Ultraviolet
Zdroj:	Applied Physics Letters. 59:534-536
ISSN:	1077-3118 0003-6951
Popis:	The energy penetration depth characteristic of the interaction of intense subpicosecond (∼600 fs) ultraviolet (248 nm) laser radiation with solid density material has been experimentally determined. This was accomplished by using a series of ultraviolet transmitting targets consisting of a fused silica (SiO2) substrate coated with an 80–600 nm layer of MgF2. The measurement of He‐like and H‐like Si and Mg lines, as a function of MgF2 thickness, enabled the determination of the energy penetration depth. It was found that this depth falls in the range of 250–300 nm for a laser intensity of ∼3×1016 W/cm2. Based on numerical simulations, it is estimated that solid density material to a depth of ∼250 nm is heated to an electron temperature of ∼500 eV.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0c3f1455d256ccdef8e3c55664adaef7 https://doi.org/10.1063/1.105430 Zobrazit plný text záznamu