Oxidation state investigation concerning liquid crystal alignment on polydimethylsiloxane layer by ion beam irradiation
| Autor: | Hae Yoon Jung, Seok Jeong Yang, Hyungjun Kim, Jong Jin Lee, Dae Shik Seo, Young Gu Kang, Hee Jun Lee |
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| Rok vydání: | 2012 |
| Předmět: |
Materials science
Ion beam Polydimethylsiloxane business.industry Analytical chemistry General Chemistry Condensed Matter Physics symbols.namesake chemistry.chemical_compound Optics chemistry X-ray photoelectron spectroscopy Liquid crystal symbols General Materials Science Irradiation van der Waals force business Layer (electronics) Polyimide |
| Zdroj: | Liquid Crystals. 39:71-75 |
| ISSN: | 1366-5855 0267-8292 |
| Popis: | This is a study of ion beam (IB)-irradiated polydimethylsiloxane (PDMS) layer-induced liquid crystal (LC) effects and electro-optical (EO) properties with varying IB incident angles. Depending on the incident angle, the homogeneously aligned LC on the PDMS layer via IB irradiation was embodied with LC alignment capability and performance. Based on X-ray photoelectron spectroscopic (XPS) analysis, the intensity of O–Si as a function of incident angle shows oxidation of the IB-treated PDMS surface. It revealed that van der Waals forces generated by delocalised electrons on the PDMS surface were attributed to LC alignment by selective destructions of the Si–C bonding in the direction of IB irradiation. EO characteristics comparable with rubbed polyimide were also achieved. |
| Databáze: | OpenAIRE |
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