On: 'Lithology discrimination for thin layers using wavelet signal parameters' by J. N. Lange and H. A. Almoghrabi (GEOPHYSICS, 53, 1512–1519, December 1988)

Autor:	Hamzah A. Almoghrabi, James N. Lange, M. K. Sengupta
Rok vydání:	1989
Předmět:	Geophysics Wavelet Thin layers Geochemistry and Petrology Lithology Thin layer Mineralogy Pore fluid Reflector (antenna) Signal Reflectivity Geology
Zdroj:	GEOPHYSICS. 54:789-789
ISSN:	1942-2156 0016-8033
DOI:	10.1190/1.1486979
Popis:	Lange and Almoghrabi have shown correctly that seismic frequency is an important parameter for discriminating among seismic lithologies and pore‐fluid types for thin layers. I would like to draw attention to Figure 3 of this paper and to the last paragraph of their conclusions, which state, “The crux of the multiparameter algorithms…is the thin layer’s frequency‐dependent reflectivity, which can be used to discriminate reflector lithologies and pore fluid type.”
Databáze:	OpenAIRE
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