Transition-Metal-Incorporated Aluminum Oxide Thin Films: Toward Electronic Structure Design in Amorphous Mixed-Metal Oxides
| Autor: | Elizabeth A. Cochran, Lisa J. Enman, Shannon W. Boettcher, Michaela Burke Stevens, Erica Pledger, Matthew G. Kast |
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| Rok vydání: | 2018 |
| Předmět: |
X-ray absorption spectroscopy
Amorphous metal Materials science Absorption spectroscopy 02 engineering and technology Electronic structure 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Amorphous solid General Energy Transition metal X-ray photoelectron spectroscopy Physical chemistry Physical and Theoretical Chemistry Thin film 0210 nano-technology |
| Zdroj: | The Journal of Physical Chemistry C. 122:13691-13704 |
| ISSN: | 1932-7455 1932-7447 |
| DOI: | 10.1021/acs.jpcc.8b00239 |
| Popis: | Amorphous metal oxides have numerous applications spanning from electronics to catalysis. The ability to rationally design the electronic structure of such materials would thus have significant impact. Previous work has shown that the amorphous structure allows for uniformly incorporating a large number of different metal cations into ultrasmooth thin films. Here we investigate how the atomic structure, electronic structure, and optical absorption properties of amorphous aluminum oxide (a-Al2O3) thin films are modulated when metal cations of V, Cr, Mn, Fe, Co, Ni, Cu, Zn, or Ga are added to form MyAl1–yOx where y varies from 0.1 to 0.7. We use X-ray absorption spectroscopy (XAS) to analyze oxidation state and local bonding around the incorporated cations (e.g., coordination number), valence-band X-ray photoelectron spectroscopy (VB-XPS) to assess the impact of the cations on the valence band electronic structure, and optical absorption spectroscopy to assess the presence and energies of new unoccupied ele... |
| Databáze: | OpenAIRE |
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