Potential-Induced Degradation and Temperature-Driven Regeneration: A Realistic Simulation
| Autor: | Hattendorf, J., Gnehr, W.-M., Löw, R., Roth, T., Koshnicharov, D., Zentgraf, M. |
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| Jazyk: | angličtina |
| Rok vydání: | 2013 |
| Předmět: | |
| DOI: | 10.4229/28theupvsec2013-4av.5.38 |
| Popis: | 28th European Photovoltaic Solar Energy Conference and Exhibition; 3303-3308 As a possible root cause of significant power loss in photovoltaic systems, the potential induced degradation (PID) is subjected to intense investigations among the photovoltaic community. An empirical acceleration model which predicts the power loss due to PID for p-type c-Si based modules has been presented in our previous publication. In the present work, we publish a model that quantifies not only the degradation but also the regeneration. The different conditions in the laboratory (full-surface grounding) and in the field (frame grounding) are considered as well. Ultimately, a realistic simulation of the PID effect under field conditions is obtained. The outcome underlines the role of the moisture film and its electrical conductivity. |
| Databáze: | OpenAIRE |
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